X-ray-Diffractometer (XRD)
| Make: | Rigaku |
| Model: | Smartlab |
| Year of purchase: | 2011 |
| Funded by: | |
| Location: | XRD/Thermo Lab |
| Contact email: | xtlab@cens.res.in |
| Book New Request | |
- Powder samples and thin films -Horizontal sample mounting
- Bragg-Brentano (theta-theta) and parallel beam (grazing incidence) geometry
- Cu KAlpha line
- 3 kW X-ray generator
- Bent/flat switchable receiving graphite monochromator
- Rotating sample plate
- 4″ wafer sample plate; maximum thickness-1 mm
- Scanning range: -3 Deg-160 Deg
- Scanning range: 2 Deg-160 Deg (2theta equivalent) for powder samples.
- Scanning range: 2 Deg-120 Deg (2theta equivalent) for thin-film samples.
- Minimum step width-0.0001 Deg.
- Variable slit widths
- Goniometer radius: 300 mm
- Scintillation counter and semiconductor detector
- Powder samples and thin films -Horizontal sample mounting
- Bragg-Brentano (theta-theta) and parallel beam (grazing incidence) geometry
- The sample can be sent in the form of
- Powder: Amount of the Sample: 5mg-10mg.
- Thin-film or Solid piece: Dimension of the sample: 10X10mm2to 20X20mm2
- Possible 2theta Range: 2°-160°
- Default step degree: 0.1°
- Automatic identification of crystal structure with PDF database
- PDXL software-based refinement to obtain lattice parameters, unit-cell volume
- Crystallite size and lattice strain analysis
- X-ray reflectivity and global fit XRR analysis software
- Rocking curve measurement
| Modes | Duration (hrs) |
|---|---|
| Powder mode(Bragg Brentano) | One hour per sample |
| Thin Film Mode(Parallel Beam) | One hour per sample |
| Sl. No. - Category | Fees ( in Rs/- ) + additional 18% GST |
|---|---|
| 01 - Academic Institutes | 600 per slot / 1 hr |
| 03 - External Industry Users | 1,200 per slot / 1 hr |
| 02 - External Industry Partner | 900 per slot / 1 hr |