Atomic Force Microscope (AFM)
| Make: | Agilent Technologies |
| Model: | 5000 |
| Year of purchase: | 2011 |
| Funded by: | |
| Location: | Micro/Spectroscopy Lab |
| Contact email: | mslab@cens.res.in |
| Book New Request | |
- Contact Mode AFM & F-Z spectroscopy for topography imaging and force measurements
- Intermittent Contact Mode AFM
- Sample types: Thin films, polished solids, dispersed powders on substrates like silicon, HOPG, Au/mica, quartz
- Sample dimensions: X,Y (max) 20 mm, 35 mm for ambient AFM imaging,
- Top down multipurpose closed loop large scanner (XY 90μm, Z 8μm),
- Top down multipurpose open small scanner (XY 9μm, Z 2μm),
- Scanners compatible with environmental and temperature control options
- AFM head with easy laser alignment and high resolution CCD camera
- Vibration and acoustic isolation chamber
- Environmental control chamber
- PicoView software capable of real-time 3D data rendering
- PicoImage software for analysis and post-processing images
- KFM, MFM, LFM, EFM, Harmonic modes are also possible.
- Scanning Tunneling Microscopy & Spectroscopy
- Liquid cell imaging
- Top down multipurpose open small scanner (XY 9μm, Z 2μm), provides atomic resolution, with interchangeable nose-cones for STM, AFM, CSAFM, AC-AFM.
- Nanolithography for patterning nanometer-scale structures.
| Modes | Duration (hrs) |
|---|---|
| Contact mode | 1 hour per sample(3 Images) |
| Non Contact (ACAFM) | 1 hour per sample(3 images) |
| Sl. No. - Category | Fees ( in Rs/- ) + additional 18% GST |
|---|---|
| 01 - Academic Institutes | 1,000 per slot / 1 hr |
| 03 - External Industry Users | 2,000 per slot / 1 hr |
| 02 - External Industry Partner | 1,500 per slot / 1 hr |