X-ray-Diffractometer (XRD)
X-ray-Diffractometer (XRD)
Make: Rigaku
Model: Smartlab
Year of purchase: 2011
Funded by:
Location: XRD/Thermo Lab
Contact email: xtlab@cens.res.in
Under maintenance

  • Powder samples and thin films -Horizontal sample mounting
  • Bragg-Brentano (theta-theta) and parallel beam (grazing incidence) geometry
  • Cu KAlpha line
  • 3 kW X-ray generator
  • Bent/flat switchable receiving graphite monochromator
  • Rotating sample plate
  • 4″ wafer sample plate; maximum thickness-1 mm
  • Scanning range: -3 Deg-160 Deg
  • Scanning range: 2 Deg-160 Deg (2theta equivalent) for powder samples.
  • Scanning range: 2 Deg-120 Deg (2theta equivalent) for thin-film samples.
  • Minimum step width-0.0001 Deg.
  • Variable slit widths
  • Goniometer radius: 300 mm
  • Scintillation counter and semiconductor detector
  • Powder samples and thin films -Horizontal sample mounting
  • Bragg-Brentano (theta-theta) and parallel beam (grazing incidence) geometry
  • The sample can be sent in the form of
  • Powder: Amount of the Sample: 5mg-10mg.
  • Thin-film or Solid piece: Dimension of the sample: 10X10mm2to 20X20mm2
  • Possible 2theta Range: 2°-160°
  • Default step degree: 0.1°
  • Automatic identification of crystal structure with PDF database
  • PDXL software-based refinement to obtain lattice parameters, unit-cell volume
  • Crystallite size and lattice strain analysis
  • X-ray reflectivity and global fit XRR analysis software
  • Rocking curve measurement
Modes Duration (hrs)
Powder mode(Bragg Brentano) One hour per sample
Thin Film Mode(Parallel Beam) One hour per sample
Sl. No. - Category Fees ( in Rs/- ) + additional 18% GST
03 - Industry 1800 per sample | 5000 per hour
01 - Other Academia 700 per sample | 2000 per hour
02 - Industry partner 1000 per sample | 3000 per hour