PANalytical (XRD)
| Make: | PANalytical |
| Model: | X-pert PRO |
| Year of purchase: | 2007 |
| Funded by: | |
| Location: | XRD/Thermo Lab |
| Contact email: | xtlab@cens.res.in |
| Book New Request | |
- - Operate at 45 kV and 30 mA
- - Cu Kα radiation ((λ = 0. 15418 nm)
- - Includes SAXS/ WAXS (~10 nm-0.1 nm)
- - Soller slits before and after the sample for minimization of out-of-plane reflection
- - Focusing Elliptical mirror assembly; 3kW X-Ray generator
- - Detector: Fast high resolution PIXCEL solid state multichannel detector
- - Beam size is rectangular width-1mm height -1 cm
- - Measurement is performed in the transmission mode.
- - Capillary or flat samples. Measurement can be performed from ambient and at high temperature (200oC) by keeping the sample inside a Programmable hot stage* (*Currently there is no dedicated hot stage)
- - Typical 2θ coverage is from 10-80 deg.
- - Expected but not done: Sub-ambient measurements. Not done owing to non-availability of a suitable cooling stage
| Modes | Duration (hrs) |
|---|---|
| Temperature dependent | Minimum one day but likely to get extended again depends on the density of data, type of experiment, etc. |
| Temperature independent (Absolute Scan) | About 1/2 -3 hours but depends very much on the intensity of the scattering |
| Sl. No. - Category | Fees ( in Rs/- ) + additional 18% GST |
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