Atomic Force Microscope
Atomic Force Microscope
Make: Agilent Technologies
Model: 5000
Year of purchase: 2011
Funded by:
Location: Micro/Spectroscopy Lab
Contact email: mslab@cens.res.in
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  • Contact Mode AFM & F-Z spectroscopy for topography imaging and force measurements
  • Intermittent Contact Mode AFM
  • Sample types: Thin films, polished solids, dispersed powders on substrates like silicon, HOPG, Au/mica, quartz
  • Sample dimensions: X,Y (max) 20 mm, 35 mm for ambient AFM imaging,
  • Top down multipurpose closed loop large scanner (XY 90μm, Z 8μm),
  • Top down multipurpose open small scanner (XY 9μm, Z 2μm),
  • Scanners compatible with environmental and temperature control options
  • AFM head with easy laser alignment and high resolution CCD camera
  • Vibration and acoustic isolation chamber
  • Environmental control chamber
  • PicoView software capable of real-time 3D data rendering
  • PicoImage software for analysis and post-processing images
  • KFM, MFM, LFM, EFM, Harmonic modes are also possible.
  • Scanning Tunneling Microscopy & Spectroscopy
  • Liquid cell imaging
  • Top down multipurpose open small scanner (XY 9μm, Z 2μm), provides atomic resolution, with interchangeable nose-cones for STM, AFM, CSAFM, AC-AFM.
  • Nanolithography for patterning nanometer-scale structures.
Modes Duration (hrs)
Contact mode 1 hour per sample(3 Images)
Non Contact (ACAFM) 1 hour per sample(3 images)
Sl. No. - Category Fees ( in Rs/- ) + additional 18% GST
03 - Industry 2500 per sample | 2500 per hour
01 - Other Academia 1000 per sample | 1000 per hour
02 - Industry partner 1500 per sample | 1500 per hour